The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 1996
Filed:
Oct. 24, 1995
Applicant:
Inventor:
Tomofune Tani, Tokyo, JP;
Assignee:
Nippon Steel Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 35 ; 437 61 ; 437 28 ; 437 26 ;
Abstract
A method of making a semiconductor device includes forming of an element isolation layer stack on a first region of a silicon substrate between adjacent element forming regions and injecting impurity ions upon a surface of the silicon substrate so as to form a diffusion layer. The diffusion layer is formed to include a first portion disposed in a surface of the substrate just beneath the element isolation layer stack and at the same time a second portion disposed in the substrate inside each of the element forming regions at a depth which is at a distance from the surface of the substrate and deeper than the first portion.