The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 1996
Filed:
Jun. 07, 1995
Fenton L Givens, Dallas, TX (US);
Ronald L Bowden, Parker, TX (US);
E-Systems, Inc., Dallas, TX (US);
Abstract
A method for selecting tie point locations within a series of overlapping images. Initially the series of images are ordered to maximize the potential for successful phase correlations between adjacent images. Adjacent pairs in the ordered images are then phase correlated to determine the translational offsets between adjacent pairs. The overlapping regions in adjacent pairs are assessed for normalized cross correlation and initial candidate tie points are selected within the regions at a reduced resolution. The initially selected tie points are then phase correlated at full resolution and any surviving candidate tie point locations are further refined to sub-pixel accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile