The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 1996
Filed:
Dec. 29, 1993
Applicant:
Inventor:
Alexander Grabner, Reutlingen, DE;
Assignee:
Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG, Reutlingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36446901 ; 364552 ; 364554 ; 36447201 ;
Abstract
In a quality monitoring method it is proposed that in continuous operation a test signal be generated, digitized, logarithmized, followed by the calculation of a frequency distribution of the test signal amplitude. The frequency distribution can then be integrated in individual areas, the result for each area forming a feature of the test signal. The features of a test signal are combined into vectors, which can be used for a better evaluation of the quality of the production plant.