The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 1996

Filed:

Jun. 21, 1995
Applicant:
Inventors:

Louis N Hutter, Richardson, TX (US);

John P Erdeljac, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 43 ; 437 52 ;
Abstract

A method for making an EEPROM (10) in a semiconductor substrate (40) and EEPROM made according to the method includes forming a gate dielectric (38), such as oxide, nitride, multilayer dielectric, or the like, on a surface of the substrate (40) and forming a polysilicon floating gate (19) on the gate dielectric (38). A control gate (25) is formed at least partially overlying the floating gate (19), and a thermal oxide layer (56) is formed on the floating gate (19) in regions that are not covered by the control gate. Thus, the thermal oxide layer (56) encases any regions of the floating gate (19) uncovered by the control gate (25) and serves as a high quality dielectric to isolate the floating gate (19) from charge loss and other deleterious effects. Then, source and drain regions (21,27) are formed in the substrate (40).


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