The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 1996
Filed:
May. 16, 1994
Yukihiko Yamaguchi, Kanagawa, JP;
Masahiro Tagi, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A lens inspection device has an objective lens composed by front and rear lenses, a two-dimensional image sensor and an image forming lens for forming a point image of light passing through the objective lens. A lens to be inspected is disposed between a light source and an object focal point of the objective lens. The light source projects a light beam through the lens to be inspected parallel to the optical axis of the objective lens, and the front lens of the objective lens is moved along the optical axis so as to shift the object focal point of the objective lens stepwise into a plurality of positions within a predetermined range including a normal focal point of the lens to be inspected. Brightness data of a point image formed on the two-dimensional image sensor is detected for each shifted position of the objective lens, and is used for judgment as to whether an actual focal point of the lens to be inspected is within a proper range. The location of the point of maximum brightness is also detected, so as to determine whether the inspected lens is misaligned as mounted in a camera or in a lens-fitted photographic film unit.