The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 1996

Filed:

Mar. 28, 1995
Applicant:
Inventor:

Toshiro Akira, Wakayama, JP;

Assignee:

Noritsu Koki Co., Ltd., Wakayama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03D / ; G03D / ;
U.S. Cl.
CPC ...
396568 ; 2505594 ; 25055944 ; 226 10 ; 355 75 ; 396620 ;
Abstract

A method of inspecting a negative film in a photographic processing apparatus includes the steps of using a detector to detect location data (i.e., preforations) arranged at equal intervals on the negative film, electrically comparing the detected location data with equally distanced reference location data having a regularity and assigned to a standard negative film, and automatically stopping the advancing movement of the negative film upon finding a fault in the regularity of the detected location data.


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