The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 1996
Filed:
May. 23, 1995
Applicant:
Inventor:
Gregory E Poirier, North Potomac, MD (US);
Assignee:
The United States of America as represented by the Secretary of Commerce, Washington, DC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250306 ; 250307 ;
Abstract
A method and apparatus detects surface properties of a sample surface using n atomic force microscope. The atomic force microscope includes a piezoelectric tube mounted on a rigid surface and separated into actuator and sensor segments. The sensor segments detect interatomic force information without snap-in effects common with cantilever mounts. A probe tip is mounted on the sensor section of the piezoelectric tube. The probe tip interacts with the interatomic forces of the sample surface. Supporting circuitry is used in either current feedback or force feedback modes.