The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1996

Filed:

Jun. 06, 1995
Applicant:
Inventors:

Chung-Fu Chang, Litchfield Park, AZ (US);

Edward E Hilbert, Litchfield Park, AZ (US);

Assignee:

Loral Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382125 ; 382157 ;
Abstract

A technique for fingerprint classification and/or identification, in which a fingerprint is defined by areas containing patterns of ridges and valleys. At least one local pattern is determined using locations and characterizations of the fingerprint, which are indicated by a rapid change in direction of the ridges and valleys. The fingerprint is classified into types based upon the relative locations and characterizations of said local pattern(s). The fingerprint identification process can utilize minutiae location and angles as well as local pattern characterizations. Neural networks are utilized in determining the local patterns. The amount of data required to store data defining the fingerprints using the local pattern and/or minutiae techniques is significantly reduced.


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