The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1996
Filed:
Mar. 15, 1995
Applicant:
Inventor:
Kazutoshi Noda, Tsukuba, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356338 ; 356343 ; 356455 ; 356 72 ; 356 73 ; 73580 ;
Abstract
An apparatus measures the diameter, relative concentration and weight of particles. The detection of scattered light produced when light is projected at particles drawn into a nozzle-shaped measuring space is used to measure particle diameter, particle concentration is measured based-on variations in the intensity of transmitted light, and particle weight is measured based on changes in operating frequency of a crystal oscillator resulting from the adhesion of particles on the surface of the crystal oscillator.