The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1996
Filed:
Dec. 22, 1994
Yoshitaka Bito, Kokubunji, JP;
Satoshi Hirata, Kokubunji, JP;
Takayuki Nabeshima, Kokubunji, JP;
Etsuji Yamamoto, Akishima, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
In an inspection method which generates a static magnetic field, a gradient magnetic field and a radio frequency magnetic field, detects nuclear magnetic resonance signals from an inspection object, computes and processes the nuclear magnetic resonance signals so detected and outputs the result of computation processing, a gradient magnetic field for generating signal attenuation by diffusion and an oscillating gradient magnetic field for generating chemical shift information and spatial information of the materials contained in the inspection object are applied, separation and acquisition of spatial information of each material contained in the inspection object are simultaneously conducted, and a measurement time is shortened.