The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1996

Filed:

Nov. 18, 1994
Applicant:
Inventors:

Masahiko Fujiwara, Kyoto, JP;

Shigeyuki Akiyama, Kyoto, JP;

Masahiko Ishida, Kyoto, JP;

Satoshi Inoue, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
250345 ; 250343 ; 250349 ; 250373 ; 25033906 ; 25033912 ; 25033913 ;
Abstract

A gas analyzer capable of simultaneously detecting two or more components in a single-cell mode and a gas-analyzing mechanism suitable for simultaneously detecting two or more components in a cross-flow modulation single-cell mode are provided. A gas analyzer unit includes two measuring cells, light sources provided on one end side of each of the measuring cells, gas filter cells with interferential gaseous components hindering a detection of components to be measured enclosed provided on the other end side of each of the measuring cells, beam splitters included in two gas filter cells, first- and fourth and second- and third detectors provided on the side of transmitting position and the side of reflecting position, respectively, of each of the beam splitters and a sampling device connected with a rotary valve.


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