The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1996
Filed:
Jun. 07, 1995
Keiji Ohsawa, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A focus detection apparatus adapted to reform images of light fluxes that pass through differing regions of a photographic lens into a pair of images on light receiving element arrays by using, for each pair of images, a field mask, a field lens, a pair of re-imaging lenses and an aperture mask having a pair of aperture openings provided in the vicinity of the pair of re-imaging lenses. The focus detection apparatus has multiple focus detection blocks that detect the focus condition of the photographic lens from positions relative to the pairs of images. The focus detection apparatus is further adapted to detect the focus condition of multiple areas on a focal plane. The focus detection apparatus includes a deflection mirror positioned between the field lens and the pair of re-imaging lenses. The deflection mirror causes the light fluxes to be deflected at nearly right angles for focus detection. Finally, a light shielding member is positioned in a triangular space determined by a beam of light for focus detecting that is closest to the pair of re-imaging lenses, a beam of light for focus detecting that is closest to the field lens and a reflecting surface of the deflection mirror.