The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1996
Filed:
Oct. 11, 1994
Applicant:
Inventor:
Kiyoshi Tsuboi, Tokyo, JP;
Assignee:
Iwatsu Electric Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73579 ; 73630 ; 73582 ; 73649 ; 364508 ;
Abstract
A nondestructive inspection method predicts the lifetime of a measured object. A measured object is made to vibrate, and there is obtained a frequency difference .increment.f between a frequency of a nth-order spectrum and a frequency of a (n+1)th-order spectrum of any one of longitudinal waves, transverse waves and distortional waves generated in the measured object when the measured object is made to vibrate. It is possible to predict lifetime of the measured object by detecting degree of deterioration of the measured object based on a relational curve representing the frequency difference .increment.f and the circumstances of use of the measured object.