The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1996

Filed:

Apr. 25, 1995
Applicant:
Inventors:

William Baker, Indianapolis, IN (US);

Raymond G Benson, Plainfield, IN (US);

Brent J Bloemendaal, Indianapolis, IN (US);

Phong B Chau, Indianapolis, IN (US);

John J Robinson, Indianapolis, IN (US);

Assignee:

ffi Corporation, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F26B / ;
U.S. Cl.
CPC ...
34550 ; 34560 ;
Abstract

A control system (80-1, 80-2) is provided for a grain dryer (10) having a path (22, 24) along which grain is conveyed from an entry opening (28) between first (12, 14) and second (18, 20) walls provided with second openings through which drying air can flow. A source (16) on the side of the first wall opposite the grain provides a flow of air through the first wall, through the grain and through the second wall to dry the grain. The grain dryer (10) further comprises metering rolls (30, 32) between the walls (12, 18, 14, 20) adjacent the end opposite the entry opening (28) to control the movement of the grain along the path (22, 24). The control system includes a first moisture probe (80-1) positioned remote from the metering rolls (30, 32), a second moisture probe (80-2) positioned adjacent the metering rolls (30, 32), and a microcomputer (150). The first (80-1) and second (80-2) moisture probes and the metering rolls (30, 32) are coupled to the microcomputer (150) for control of the metering rolls (30, 32) based upon the outputs of the moisture probes (80-1, 80-2).


Find Patent Forward Citations

Baker, William. (1996). Control system for a grain dryer and probe mounting apparatus therefor (U.S. Patent No. 5570521). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5570521

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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