The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Oct. 20, 1994
Applicant:
Inventors:
Herve, P Gillard, Viry Chatillon, FR;
Veronique H Prejean-Lefevre, Sceaux, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382149 ; 382142 ; 382144 ; 382260 ;
Abstract
Quantitative characterization of a crack detection analysis method is achieved by determining the detection sensitivity and background noise produced by the analysis method by suitably processing images obtained from one or more control specimens prepared by the method and subjected to appropriate and optimized conditions of illumination. In addition, the crack detection analysis method is optimized by looking for the parameters which influence the method and determining the value thereof which maximizes detection sensitivity and minimizes background noise.