The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Jul. 18, 1995
Shintaro Komatani, Miyanohigashi-machi, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A method and apparatus for determining the concentration of an element in a sample with a fluorescent X-ray qualitative analytical procedure is provided. An X-ray tube radiates a sample with primary X-rays to create fluorescent X-rays from elements in the sample. The computer system can have preset conditions for a measurement of a predetermined concentration amount of an element at a predetermined probability of accuracy. The X-rays coming from the sample are detected, and calculations are performed to determine both the concentration of the element and the predetermined probability of accuracy. These values can be compared automatically with the predetermined values and, when the comparison indicates that the calculated concentration of the element meets the predetermined amount or is greater within the predetermined probability of accuracy, the measurement cycle can be stopped, thereby avoiding unnecessary measurement time.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile