The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Oct. 05, 1994
Ramachandra P Kunda, Milpitas, CA (US);
Adam C Malamy, Palo Alto, CA (US);
Marc Levitt, Sunnyvale, CA (US);
Sun Microsystems, Inc., Mountain View, CA (US);
Abstract
Lists of candidate faults within an integrated circuit are generated, for the purpose of fault diagnosis, by performing a partial intersection of fault lists output from a full-scan test such as a JTAG test. The fault lists represent all candidate faults which may be responsible for producing a mismatched bit between an output test vector and an expected test vector provided by the full-scan test. The partial intersection is performed by first determining the number of occurrences of each candidate fault within all lists associated with each mismatched bit. Then, only faults which occur at least a pre-selected number of times are selected. In this manner, lists of candidate faulty gates are generated based on the relative degree of intersection between fault sets. The lists of candidate faulty gates are input to an X-Y location tool which determines the physical location on the integrated circuit of each of the candidate faulty gates to facilitate the efficient examination of each of the candidate faulty gates by test personnel.