The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Sep. 06, 1994
Koichi Terauchi, Toyohashi, JP;
Tomomi Ono, Akashi, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
The optical properties measuring device of this invention performs preliminary emission of light from a light source prior to main light emission for sample measurement, and approximates the optical properties of the sample based on the output from a photosensor at the time of preliminary emission. Then, based on the approximated optical properties, the luminous energy for the main light emission for sample measurement is determined. Main light emission from the light source in accordance with the luminous energy determined this way is then performed, and the sample's optical properties are calculated based on the output at this time. In other words, this invention is characterized in that the sample's optical properties are approximated beforehand by means of this preliminary light emission, and the luminous energy at the time of the main light emission to perform sample measurement is changed in accordance with the result of this calculation. In this way, high-precision measurement of a sample may performed at all times regardless of the optical properties of the sample.