The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 1996

Filed:

Jun. 01, 1994
Applicant:
Inventors:

Avishai Nevel, Providence, RI (US);

John B Lawson, Providence, RI (US);

Kendall W Gordon, Jr, North Kingstown, RI (US);

David Bonneau, West Boylston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356385 ; 25055924 ; 356238 ; 356430 ;
Abstract

A system and method for electronically comparing yarn lengths to assist in grading yarn qualities, in which the yarn diameter or another yarn quality at a number of locations along the total length of the yarn is measured, and representations of the measured qualities are displayed to allow comparison of portions of the yarn.


Find Patent Forward Citations

Nevel, Avishai. (1996). System and method for electronically displaying yarn qualities (U.S. Patent No. 5570188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5570188

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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