The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 1996

Filed:

May. 17, 1995
Applicant:
Inventor:

Shigeru Maruyama, Kanagawa, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
327404 ; 327407 ; 327108 ; 326 16 ;
Abstract

A signal line switching circuit includes a switching and driving circuit connected in parallel to a pair of complementary signal lines to be switch-controlled and having a current supply capability sufficiently larger than that of an amplifier having its pair of complementary outputs connected to the pair of complementary signal lines. The switching and driving circuit can supply onto at least one of the pair of complementary signal lines a signal which is independent of a level of the outputs of the amplifier and which corresponds to a test discrimination result signal.


Find Patent Forward Citations

Maruyama, Shigeru. (1996). Signal line testing circuit causing no delay in transmission of a normal (U.S. Patent No. 5570058). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5570058

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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