The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
Feb. 01, 1994
Applicant:
Inventor:
Raphael C Lee, Chicago, IL (US);
Assignees:
Massachusetts Institute of Technology, Cambridge, MA (US);
Arch Develop., Chicago, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61K / ; A61K / ; A61K / ; A61K / ; A61K / ; A61K / ; A61K / ;
U.S. Cl.
CPC ...
514654 ; 514356 ; 514211 ; 514171 ; 514174 ; 5142258 ; 514648 ; 424646 ;
Abstract
This invention pertains to a method for controlling wound scar production by administering a calcium antagonist, alone or in a combination with or followed by a steroid, to the wound site. The method can be used to minimize wound scars, such as hypertrophic wound healing disorders, keloids and burn scar contractures in humans or other mammals, particularly those individually prone to excesssive scarring.
Lee, Raphael. (1996). Control of wound scar production (U.S. Patent No. 5569678). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5569678
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile