The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 1996

Filed:

Jul. 05, 1995
Applicant:
Inventors:

Godfrey P D'Souza, San Jose, CA (US);

James F Testa, Mountain View, CA (US);

Assignee:

Sun Microsystems, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; H03K / ;
U.S. Cl.
CPC ...
36518905 ; 36523008 ; 365233 ; 327199 ; 327208 ; 327212 ;
Abstract

A data latch with reduced data signal leakage includes a latch circuit and a clock buffer circuit which provides a differential clock signal to the input transmission gate of the latch circuit. The clock buffer circuit is biased between upper and lower supply voltage potentials which are higher and lower, respectively, than those between which the latch circuit is biased. This causes the differential clock signal to be overdriven with respect to the incoming data signal which is latched by the latch circuit. As a result, the input transmission gate of the latch circuit is reverse-biased during the inactive state of the differential clock signal, thereby isolating the storage node within the latch circuit and preventing signal leakage therefrom.


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