The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 1996
Filed:
Apr. 25, 1995
Ken Uemura, Yokohama, JP;
Yukiko Nagashima, Yokohama, JP;
Yasunari Saito, Funabashi, JP;
Takao Kurita, Yokohama, JP;
Tetsuo Miyake, Toyohashi, JP;
Kazuaki Shimizu, Yokohama, JP;
Asahi Glass Company Ltd., Tokyo, JP;
Abstract
A method of measuring a distortion of a transmitting beam, characterized in that a transmitting beam is emitted from a beam generator and projected onto a screen as a bright spot, the bright spot is scanned over a surface of the screen, and a distortion of the transmitting beam is measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon transmitting through a measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon not transmitting through the measured body. A surface shape of a three-dimensional object may also be measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon being reflected from a surface of a three-dimensional measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon being reflected from a surface of a reference body. The present invention provides measurements having improved accuracy for objects of any size irrespective of the resolution of the beam receiving device.