The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 1996
Filed:
Dec. 05, 1994
Lam F Wong, Fairport, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A method and apparatus for minimizing image smear. A plurality of sheets are printed, each having the same test pattern thereon but varying a sheet transport speed as each sheet is printed. The sheets are then scanned by the machine and a velocity profile for each sheet is created. The velocity profile is then used to determine a standard deviation and a mean velocity which are then calculated and stored or can be plotted for each sheet. The point at which the relationship between the standard deviation and the mean results in the lowest value is the optimum speed for the subsystem being calibrated. The test is then performed on a second subsystem and repeated several times so that the optimum speeds for the pre and post transfer drives are quickly and easily determined.