Low profile coin analyzer apparatus

Abstract

An electronic coin analyzer having a low profile that is especially useful for applications previously limited to mechanical devices includes a test coin path aligned with a coin-receiving opening in a faceplate and a rejected coin path laterally offset from the test coin path and aligned with a coin reject slot in the faceplate. An opening is defined between the test coin path and the rejected coin path that is larger than an acceptable coin/token. A coin deflecting surface is selectively positioned in the test coin path at the opening by an electromagnetic actuator in order to laterally deflect coins rolling along the test coin path toward the rejected coin path. Coins not deflected continue rolling past the opening, as a result of inertia, to an accepted coin path. An electronic control is provided having a test coin sensor and a circuit which causes the actuator to withdraw the deflecting surface from the test coin path in response to an acceptable coin. Multiple denominations of coins and/or tokens may be accepted by providing the control with the capability of identifying a test coin in the test coin path as a particular one of a group of acceptable coins or tokens. A coin accelerator may be provided in the rejected coin path to intercept forward motion of the coin and convert this motion to motion in the opposite direction. A kicker device may be provided in the test coin path in order to accelerate a coin travelling through the test coin path.