The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1996
Filed:
Jul. 14, 1993
Atsushi Watanabe, Yamanashi, JP;
Taro Arimatsu, Yamanashi, JP;
Fanuc Ltd., Yamanashi, JP;
Abstract
A taught data setting method in a visual sensor system, capable of automatically and rapidly setting optimum taught data. An image of a single circular sample is subject to image processing to determine formal setting values of first to sixth parameters (P1-P6), respectively corresponding to circle diameter, circumference, area and deformation degree, and types of a smoother filter and an emphasizing filter. Many sample images are then subject to image processing which utilizes the formal setting values, to thereby determine set center positions of the respective images. An optimum value of the first parameter enough to minimize the sum of the squares of the errors between the set center positions and image center positions is automatically determined (100), the image center positions being detected while the first parameter is changed, with the second to fourth parameters kept fixed at their formal setting values. Similarly, optimum values of the second to fourth parameters are determined (100-103). Image processing is further performed while changing filter types and keeping the first to fourth parameters fixed at their optimum values, thereby determining optimum values of the fifth and sixth parameters (108,109).