The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 1996

Filed:

Jun. 30, 1994
Applicant:
Inventors:

David R Schricker, Dunlap, IL (US);

Rolland D Scholl, Dunlap, IL (US);

Satish M Shetty, East Peoria, IL (US);

David G Young, Peoria, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
36455101 ; 364554 ; 36442403 ; 340439 ; 340679 ;
Abstract

A method and apparatus are disclosed for monitoring similar machine components loaded in parallel to produce trend information useful in diagnosing and predicting component degradation or failure. The invention is illustrated for engine cylinder exhaust port and manifold temperature measurements. In one embodiment split exhaust manifolds are each provided with a sensor to produce signals indicating the exhaust temperature. A computer-based trending module receives the parallel temperature information, periodically determines a difference between the temperatures, and averages the differential temperature readings over a predefined trend period to generate a trend values. A trend based on a plurality of the trend points is generated and monitored for changes which indicate the possible degradation of one of the measured components. A trap window (trend definition) comprising one or more machine operating parameter levels which must be met to generate a trend value can be used to improve the diagnostic value of the trending. The trap window can be further refined with a trap-lag period allowing the measured components to reach a steady state when a new trap window is entered before trend values are generated. The invention can be used with both stationary and mobile machines, with the data trending and monitoring performed either onboard or remotely from the machine.


Find Patent Forward Citations

Loading…