The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1996
Filed:
Jun. 12, 1995
Holger Ernst, Hamburg, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
Integrated circuits which process analog signals and consist of a plurality of separate functional blocks are difficult to test because the terminals of, internally interconnected functional blocks cannot be simply fed out in view of the limited number of external terminals. In order to test the integrated circuit by testing individual functional blocks separately, it is proposed to connect inputs and outputs of functional blocks are connected to switches enabling connection of these functional blocks to external terminals. The switches are controlled by storage stages which are loaded via a test input which is connected to comparators. These comparators compare the input signal with various reference voltages, the voltage ranges between the reference signals being associated with the logic values '0' and '1' as well as with a clock signal value. This enables a series of data with a data clock to be applied via only one test input in order to switch the internal switches in conformity with the desired test state.