The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1996
Filed:
Jan. 18, 1995
Michel Hamelin, St-Lazare, CA;
Frank Kitzinger, Montreal, CA;
Noranda, Inc., Toronto, CA;
Abstract
A magnetic testing device for detecting loss of metallic area and internal and external defects in elongated magnetically-permeable objects includes a permanent magnet assembly having poles adapted to be spaced apart in the longitudinal direction of an elongated object for inducing a longitudinal magnetic flux in a section of the object between the poles of the magnet assembly, the magnet assembly being strong enough to magnetically saturate the section of the object. A tubular pole piece is arranged to surround the object adjacent each pole of the permanent magnetic assembly for directing the magnetic flux into the object at one pole and out of the object at the other pole. Hall effect devices are placed in the path of the magnetic flux for sensing the reduction of the flux passing through the elongated object due to any reduction of cross-sectional area of the elongated object between the pole pieces caused by loss of metallic area in the elongated object. A leakage flux sensor is installed between the pole pieces for detecting an external and internal defects in the objects. Circuitry is provided for increasing the linear resolution of the metallic area measurement of the object, whereby signals obtained correspond more closely to the variations in the metallic area of the elongated object. Preferably, the circuitry combines the local fault (LF) signal with the loss of metallic area (LMA) signal to benefit from both the high linear resolution of the LF signal and the long range stability of the LMA signal to improve the resolution of the LMA signal.