The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1996
Filed:
May. 03, 1993
Paul B Tuck, Wilmington, NC (US);
Gregory C Gilmore, Wilmington, NC (US);
General Electric Company, San Jose, CA (US);
Abstract
A method and an apparatus for measuring a tapered cylindrical object, such as a mandrel. The apparatus employs a linear positioning table assembly with a slide mounting for a laser micrometer, an axial position stepper motor for moving the laser micrometer stepwise along the axial length of the mandrel, and an angular position stepper motor for stepwise rotation of the object. The laser micrometer measures a cross-sectional diameter of the mandrel at a plurality of angular positions of the mandrel for each one of a plurality of axial positions along the length of the mandrel. The measurements taken at a plurality of angular positions constitute a circumference profile at that axial position. The circumference profiles at a plurality of axial positions constitute the contour profile of the mandrel. The acquired data are compared to desired mandrel contour profile data.