The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 1996

Filed:

Apr. 06, 1995
Applicant:
Inventors:

Masao Futamura, Nagoya, JP;

Yukiyoshi Muto, Nagoya, JP;

Masahiro Mizuno, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; D05B / ;
U.S. Cl.
CPC ...
36447009 ; 1121025 ; 11247006 ; 11247519 ;
Abstract

An original picture of a pattern is scanned with an image scanner to obtain bitmap image data. A border line defining the original picture is extracted. A closed region enclosed by the border line is subjected to a linearizing process. Shape-defining line data is produced for the closed region and stitch data for entirely covering the closed region with zigzag stitches when the closed region can completely be linearized by a number of sequential pixel deleting cycles not greater than a given number. Border line data is produced and stitch data for entirely covering the closed region with satin stitches is automatically produced when the closed region could not be completely linearized by the number of sequential pixel deleting cycles within the given number. Thus, stitch data for satisfactorily embroidering a pattern consisting of a plurality of partial patterns respectively having different widths can be readily and automatically produced from the original picture of the pattern.


Find Patent Forward Citations

Futamura, Masao. (1996). Embroidery stitch data producing apparatus and method (U.S. Patent No. 5563795). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5563795

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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