The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 1996

Filed:

May. 05, 1995
Applicant:
Inventors:

Steven W Holt, Sidney, OH (US);

Jack Fletcher, Sidney, OH (US);

Shu An, Sidney, OH (US);

Assignee:

Aluminum Company of America, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; B07C / ;
U.S. Cl.
CPC ...
356237 ; 356240 ; 2502 / ; 2502 / ; 209585 ; 209577 ; 209588 ;
Abstract

An apparatus and method for detecting the presence material irregularities and holes in thin walled opaque objects such as can ends having a generally centrally disposed integral rivet formed therein. A radiation source is focused so that a substantial portion of emitted radiation is concentrated on the portion of a can end in which the rivet is formed.


Find Patent Forward Citations

Holt, Steven. (1996). Method and apparatus for testing the material integrity of a converted (U.S. Patent No. 5563700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5563700

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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