The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1996
Filed:
Apr. 30, 1993
Jerry B Roberts, Arlington, MA (US);
Microtouch Systems, Inc., Metheun, MA (US);
Abstract
A method and apparatus is disclosed, particularly, though by no means exclusively, useful in touch--screen computer CRT display systems and the like, and more generally in other force and/or torque measurement systems, as in weighing and the like, in which (1) lineal and/or rotational acceleration of the system is sensed in response to inertial interference effects such as tilt or movement that introduce errors into the force and/or torque measurements, and/or (2) inertial error correction from the force data itself is obtained, such as derivative order corrections; and such data is used to correct the force and/or torque measurements. A novel calibration technique for deriving appropriately descriptive coefficients to the particular system for the correcting data, is also disclosed.