The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1996
Filed:
Dec. 14, 1994
Goroh Bessho, Yokohama, JP;
Koichi Ejiri, Narashino, JP;
Ricoh Co., Ltd., Tokyo, JP;
Abstract
A method and apparatus for detecting the skew angle of a document image. Skew angle determination is performed by the steps of determining a set of sampling points from an input document image and processing X and Y coordinates of the sampling points in order to calculate a regression coefficient of the sampling points. The skew angle of the document is determined using the regression coefficient. To evaluate a calculated skew angle which corresponds to the regression coefficient, a correlation coefficient is calculated and evaluated. As coordinates of sampling points are obtained for a plurality of sets of data corresponding to different ruled lines or lines of characters, a histogram may be used to determine the most probable skew angle.