The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 1996

Filed:

Sep. 08, 1994
Applicant:
Inventors:

Hideyuki Horiuchi, Abiko, JP;

Norio Oowada, Katsuta, JP;

Hideki Asai, Mito, JP;

Ryohei Yabe, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 39 ; 356 73 ;
Abstract

A method and an apparatus for flow type particle image analysis generate a pulse light emission in any one of the odd and the even field image reading-out periods, and multiple exposure is prevented by prohibiting the next pulse light emission in the predetermined period after the emission. The method includes the steps of flowing a sample liquid in a flow cell, detecting particles passing through the flow cell by a laser beam, making a flash lamp emit light after the predetermined period from the particle detection, picking up a particle still image by a TV camera, and further preventing the multiple exposure by providing emission-prohibiting periods which are established by controlling the timings of flash lamp emission and image transfer with the TV camera, a flash lamp emission control circuit, and an image processing control circuit which are controlled by a central control part.


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