The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 1996
Filed:
May. 25, 1995
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A level F.sub.A at a shot center of a specified shot is measured. A level F.sub.B is measured at a nonexposure region. A level difference .DELTA.F is calculated based on the level F.sub.A at the shot center and the level F.sub.B at the nonexposure region. After the level difference .DELTA.F is calculated for all the specified shots, an average value .DELTA.F.sub.ave of level differences .DELTA.F is calculated. Thereafter, focusing based on the average value .DELTA.F.sub.ave and subsequent exposure are executed for the respective shots in a step-and-repeat manner. Thereby, a focusing method in photolithography enables formation of elements having good pattern configuration even if the pattern is miniaturized to a higher extent in accordance with high integration.