The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 1996
Filed:
Jul. 03, 1995
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination includes a filter for limiting the dynamic range of an X-ray image formed on an X-ray detector by irradiation of an object, for example a patient to be examined, by means of X-rays. The filter has a number of electrodes and grains or powder particles containing an X-ray absorbing material and suspended in a suspension liquid. When a voltage is applied to electrodes, X-ray absorbing material in the suspension will move to the excited electrodes under the influence of electrophoresis. A distribution with a desired X-ray absorption profile is adjusted by application of a suitable voltage pattern. The electrodes may have dimensions of, for example 0.5.times.0.5 mm, enabling an X-ray absorption profile to be obtained with a high spatial resolution. The X-ray absorption profile can be changed within a brief period of time, for example within one second, by changing the voltage pattern on the electrodes.