The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 1996
Filed:
Jan. 31, 1995
Applicant:
Inventors:
Jerzy S Krasinski, Stillwater, OK (US);
Yin M Wang, Stillwater, OK (US);
Assignee:
Minnesota Mining and Manufacturing Company, St. Paul, MN (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
25055926 ; 2502086 ; 25055945 ; 25055948 ; 356431 ; 356239 ;
Abstract
An apparatus for sensing the deflection of a beam directed at an article detects slight deflection of the beam when the beam is directed at a large angle of incidence. The large angle of incidence increases the apparatus sensitivity to detect certain characteristics within an article which cause slight deflection, and allows the use of smaller optical elements. The apparatus can detect defects such as coating voids, streaks, and caliper variations when transparent materials are coated onto transparent substrates.