The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 1996
Filed:
Nov. 29, 1994
Katsuhiko Araya, Kyoto, JP;
Youzo Morita, Kameoka, JP;
Shingo Sumi, Moriyama, JP;
Hiroaki Matsuhisa, Muko, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A non-dispersive infrared analyzer and method for analyzing a concentration in a gas utilizes an infrared light source and a cell configured to have a gas flow therethrough. The cell also has an infrared light passage through which a sample gas stream and an infrared light beam can travel. A sector has at least two filters for filtering infrared light, and is provided with the apparatus. The sector alternately inserts the at least two filters into the infrared beam. A detector detects wavelengths of the infrared light beam which corresponds to an absorption band of the gas to be measured, and a second wavelength which corresponds to an absorption band of the preselected reference gas. The detector receives the infrared light beam after the light beam has traveled through the sample cell. The detector generates an electrical signal based upon the detected infrared light, which is correlated with a position indicating apparatus to provide a normalized intensity ratio, which is used to calculate the concentration of the gas to be measured in the cell.