The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 1996
Filed:
Feb. 09, 1995
Applicant:
Inventors:
Patrick C Pomeroy, Concord, CA (US);
Randall Madsen, San Diego, CA (US);
Wai P Chan, Castro Valley, CA (US);
Gary Lemke, Danville, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M / ;
U.S. Cl.
CPC ...
4352891 ; 4353071 ; 422100 ; 422116 ;
Abstract
A method and an apparatus useful as a secondary level assaying tool for qualitative and quantitative confirmation of results obtained by primary separation techniques and their correlation with a specific function or property of the tested sample. An apparatus is useful for the post-transfer development assaying on the solid support of the biological samples already assayed by standard separation techniques such as blotting or chromatography.
Quick Actions:
Pomeroy, Patrick. (1996). Method and apparatus for post-transfer assaying of material on solid (U.S. Patent No. 5559032). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5559032
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile