The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1996
Filed:
May. 30, 1995
Richard H Johnson, San Jose, CA (US);
Douglas Noddings, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for testing a device driver utilized with a data processing system is disclosed. In a first aspect, the method comprises the steps of inputting a script file to a test engine to provide a test to the device driver, compiling the test engine across multiple operating system platforms. The method also includes sending a command that indicates the test is to be provided to the device driver and sending results of the test of the device driver back to the test engine. In another aspect, a system is disclosed for testing a device driver utilized in a data processing system. The system comprises a script file for providing a test of the device driver and a test engine for receiving the test from the script file. The system also includes a plurality of platform specific library routines for compiling the test engine and test across multiple operating system and multiple device types and for sending the test to the device driver, wherein the test engine receives the results from the test from the device driver upon receiving a system call from the test driver. Through the use of a system and method in accordance with the present invention, device driver tests can be made self-checking and require minimal human intervention to run the tests. In addition, the tests can be rerun at any time to retest new versions of device drivers and/or new versions of the operating system environments.