The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1996
Filed:
Jan. 10, 1995
Masahiro Oono, Tokyo, JP;
Tsuyoshi Itoh, Tokyo, JP;
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
An apparatus and method for inspecting a beam splitter which is to be used in splitting a laser beam. The apparatus includes laser beam sources (including laser diodes and collimator lenses) for projecting a plurality of images through the beam splitter being inspected and onto a single photo detector. Based on the relative positions of the images on the photo detector, an accuracy characteristic of the beam splitter to be inspected can be determined. Each of the light beams emitted from the beam sources are transmitted through a condenser lens and through a pinhole provided in a diaphragm plate having a ground glass plate on an incident side. The pinhole provides a point source which is converted into a parallel beam by a lens. The beams are then made incident on the beam splitter to be inspected, are transmitted and reflected, and are emitted onto the photo detector in a relationship related to the accuracy characteristic of the splitter. The beams form images on a monitor connected to the photo detector.