The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1996
Filed:
Mar. 17, 1995
Motonori Kanaya, Ohmiya, JP;
Fuji Photo Optical Co., Ltd., Saitama-ken, JP;
Abstract
A main measuring light having a first wavelength is projected onto a work and a reference surface to produce first interference fringes and a determination light having a second wavelength slightly different from the first wavelength is projected onto the work and the reference surface to produce second interference fringes. Whether the surface of the work is concave or convex, in which direction the surface inclines or the refractive index distribution of the work is determined on the basis of the relative positions of the first and second interference fringes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile