The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1996
Filed:
Mar. 14, 1995
Nobuyuki Yano, Okazaki, JP;
Nidek Co. Ltd., , JP;
Abstract
An ophthalmometric apparatus, such as an apparatus for measuring the opacity of the lens of the examinee's eye, comprises an alignment light projecting optical system for projecting alignment light rays on the examinee's eye, a position detecting optical system for detecting the position of a bright spot of corneal reflection formed by the alignment light projecting optical system, a position calculating means for calculating position data representing the position of the examinee's eye relative to a reference position on the basis of detection data provided by the position detecting optical system, an observation optical system for observing the front of the examinee's eye, provided with a filter means for intercepting at least part of the alignment light rays, and a display means for displaying the front of the examinee's eye, the bright spot of the corneal reflection, an image of a reference mark, and position data representing the position of the examinee's eye in an XYZ coordinate system on the observation optical system.