The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1996
Filed:
Nov. 07, 1994
Applicant:
Inventor:
Kazuhiko Nakade, Kyoto, JP;
Assignee:
Murata Kikai Kabushiki Kaisha, Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
D01H / ; D01H / ;
U.S. Cl.
CPC ...
57264 ; 57265 ;
Abstract
A sliver quality judging method in a textile machine which method can judge whether a spindle whose operating condition is bad is defective or not. Statistics are taken with respect to yarn quality information, including the breakage of yarn, uniformity, etc., for each spindle, then a spindle inferior in such yarn quality is picked out, and from the form of changes with time in the yarn quality information of that spindle there is made judgment whether the spindle is defective or sliver is of poor quality.