The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1996

Filed:

Oct. 04, 1994
Applicant:
Inventors:

Jehad Khoury, Concord, NH (US);

Charles L Woods, Stow, MA (US);

Jack Fu, Brighton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H / ; G03H / ;
U.S. Cl.
CPC ...
359559 ; 359 10 ; 359 16 ;
Abstract

An object beam is passed through an aberrating medium to produce a diffraction distorted image therein, which is imaged upon a spatial light modulator. A probe beam measures the phase aberrated wavefront within the aberrating medium and is used to produce an interference pattern which is employed to produce phase encoding signals to be fed back to the spatial light modulator for compensating in part for the phase distortion of the phase aberrated wavefront. The result is an output image having a substantially reduced degree of distortion.


Find Patent Forward Citations

Loading…