The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1996

Filed:

Aug. 22, 1995
Applicant:
Inventors:

Yoichi Iki, Kawasaki, JP;

Nobuyki Miyake, Yokohama, JP;

Yasunori Ueno, Kawasaki, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351205 ; 351211 ; 351212 ; 351247 ;
Abstract

An eye measuring apparatus includes a refracting power detector for measuring the refracting power of an eye to be examined, a fogging producer for moving the position of a target image in the direction of the optical axis of the eye to be examined, and a feedback controller for receiving an output from the refracting power detector, and moving the position of the target image in a direction, in which accommodation of the eye to be examined is relaxed, in accordance with refracting power information measured in a predetermined meridian direction of the eye to be examined and astigmatic information of the eye to be examined obtained from refracting power values measured in a plurality of meridian directions of the eye to be examined.


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