The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 1996
Filed:
Nov. 14, 1994
Alfons Ernst, Traunreut, DE;
Gunther Nelle, Bergen, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A length measuring system having a scale with a first portion and a second portion separated by a gap, wherein the first and second portions each have incremental graduations. The system further includes a scanner unit for scanning the incremental graduations of the first and second portions, wherein the scanner unit has two groups of scanner elements spaced apart by a greater than the width of the gap. The system has at least one control track parallel to and next to the incremental graduations of the first and second portions. A further scanner element is provided to scan the at least one control track and produce an output signal, wherein the output signal is a function of the absolute position of the first and second portions and controls a switchover from one group of scanner elements to the other group of scanner elements. The absolute position of the first and second portions is derived from the control track over the entire measurement length of the scale and the measurement increment of the control track is greater than the measurement increment of the incremental graduations of the first and second portions.