The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 1996
Filed:
Dec. 16, 1993
Hidehiko Furuhashi, Fujisawa, JP;
Toshiaki Nihoshi, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope has an objective optical system coupled to an observation optical system with parallel optical axes. A stage, which holds a sample, rectilinearly moves in a direction toward and away from the observation optical axis, which is perpendicular to the plane of the stage. The objective optical system rectilinearly moves in a direction perpendicular to the movement of the stage. The microscope thus permits viewing of a large sample with a small stroke of the stage, whereby a compact and lightweight structure may be achieved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile