The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1996
Filed:
Sep. 25, 1995
Kenichi Mitsumori, Miyagi-ken, JP;
Koji Kikuchi, Miyagi-ken, JP;
Frontec Incorporated, Sendai, JP;
Abstract
An apparatus and a method for inspecting a thin film transistor easily and securely with good reproducibility without adverse effect on elements of the thin film transistor even if the thin film transistor is not provided with a capacitative element. The apparatus includes an inspection signal generating device for inputting drive pulse signals and test pulse signals, respectively to a gate electrode; a test voltage generating device for inputting a test voltage to the source electrode in synchronism with the drive pulse signals; an external electrode arranged to be opposed to the drive electrode and forming therebetween a capacitance for storing test charges; and an electric signal detecting device for detecting electric signals output from the capacitance formed between the drive electrode and the external electrode to the source electrode in synchronism with test pulse signals to be input to the gate electrode.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile